TC4426 PDF

They will not latch up under any conditions within their power and voltage ratings. They are not subject to damage when up to 5V of noise spiking of either polarity occurs on the ground pin. They can accept, without damage or logic upset, up to mA of reverse current of either polarity being forced back into their outputs. All terminals are fully protected against up to 2kV of electrostatic discharge.

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Drive Capability Supply Voltage. Reverse Current Down to — 5V. Part No. They will not latch up under any. They are. They can accept,. All terminals are fully protected against up to 4kV of. These drivers have matched input to output leading edge.

They are pin. NOTES: 1. TC has 2 inverting drivers; TC has 2 noninverting drivers. TC has one inverting and one noninverting driver. Ground any unused driver input. Supply Voltage Maximum Chip Temperature Storage Temperature Range Lead Temperature Soldering, 10 sec Package Thermal Resistance.

Operating Temperature Range. C Version E Version M Version Unused devices must be stored in conductive. Protect devices from static discharge and static fields. These are stress ratings only and functional. Exposure to absolute maximum rating conditions for extended periods may. GND 3. Test Conditions. Min Typ Max Unit. Input Current. R O Output Resistance. Withstand Reverse Current.

Switching Time Note 1. Power Supply. I S Power Supply Current. NOTE: 1. Switching times are guaranteed by design. Figure 1. TC - TC 1. Download TC Datasheet. They will not latch up under any conditions within their power and voltage ratings. They are not subject to damage when up to 5V of noise spiking of either polarity occurs on the ground pin.

They can accept, without damage or logic upset, up to mA of reverse current of either polarity being forced back into their outputs. All terminals are fully protected against up to 4kV of electrostatic discharge. These drivers have matched input to output leading edge and falling edge delays, tD1 and tD2, for processing short duration pulses in the 25 nanoseconds range. Unused devices must be stored in conductive material.

Stresses above those listed under "Absolute Maximum Ratings" may cause perma- nent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions above those indicated in the operation sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

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